Book
Editors:
Kim, Daniel H.; Vaccaro, Alexander R.; Fessler, Richard G.
Authors:
Abram, Leon J.; Akbarnia, Behrooz A.; Albert, Todd J.; Alexander, Joseph T.; Allaoui, Mohammed; Amundson, Glenn M.; An, Howard S.; Apfelbaum, Ronald I.; Arlet, Vincent; Asher, Marc A.; Assaker, Richard; Bagheri, Ramin; Bagley, Carlos; Barbier, Dragos Doru; Barua, Manali; Becker, Bryan; Bednar, Drew A.; Beisse, Rudolph; Benzel, Edward C.; Bertagnoli, Rudolf; Betz, Randy; Beutler, William J.; Bianco, Sabatino; Birch, Barry D.; Boakye, Maxwell; Bolger, Ciaran; Bose, Bikash; Branch, Charles; Brantigan, John W.; Brayda-Bruno, Marco; Bridwell, Keith H.; Brodke, Darrell S.; Brooks, Nathaniel P.; Brown, David; Bruner, Harlan J.; Burkus, Kenneth; Burton, Douglas C.; Byrd, Abbott; Campbell, Mitchell J.; Chapman, Jens R.; Chopin, Daniel; Clements, David; Couture, Dan; Crawford, Alvin; Dailey, Andrew T.; Darden, Bruce V.; Davis, Reginald J.; Day, Thomas; Denaro, Enzo; Deutsch, Harel; Martino, Alberto Di; Dick, Jeffrey C.; Dickman, Curtis A.; Dimar II, John R.; Dolenc, Vinco V.; Drake, John S.; Dryer, Randall F.; Eichenbaum, Matthew D.; Errico, Thomas J.; Fassett, Daniel R.; Fayyazi, Amir H.; Fehlings, Michael G.; Fessler, Richard G.; Fichten, Anthony; Finkenberg, John G.; Fisicaro, Marc; Fox, Andrew; Fredrickson, Bruce E.; Garcia-Bengochea, Javier; Geisler, Fred H.; Gerszten, Peter C.; Giuffre, James M.; Glassman, Steven D.; Glazer, Paul A.; Gokaslan, Ziya L.; Govender, Preneshlin V.; Grauer, Jonathan N.; Gravori, Tooraj; Griffith, Steven L.; Griss, Peter; Gundanna, Mukund I.; Haid, Regis W.; Harms, Jürgen; Hartl, Roger; Hauptman, Jason S.; Heary, Robert F.; Heim, Stephen E.; Henderson, Fraser C.; Hilibrand, Alan S.; Hunt, Leonel A.; Hurlbert, John; Husted, Daniel F.; Jackson, Roger P.; Jankowitz, Brian; Janssen, Michael E.; Jenkins III, Arthur L.; Jenny, Philippe; Johnson, Patrick; Johnson, John R.; Jolley, Jay E.; Kalfas, Iain H.; Kalluri, Prakasam; Kaneda, Kiyoshi; Katsos, Mara; Khoo, Larry T.; Kim, Daniel H.; Kim, Kee D.; Kim, Paul; Klimo, Paul; Kralick, Francis; Krishnaney, Ajit A.; Kuntz, Charles; Lam, Chi N.; Lauryssen, Carl; Le, Hoang; Le Huec, Jean-Charles; Lebwohl, Nathan H.; Lee, Max C.; Legnani, Federico G.; Lenke, Lawrence G.; Lesutis-Fitzhenry, Mary; Linville II, Douglas A.; Liu, James K.; Lowery, Gary L.; McCormick, Paul C.; McEvoy, Linda; McGuire, Robert A.; McManus, Anne C.; Maher, Colby; Mantha, Ajay; Marcotte, Paul J.; Mathews, Hallett H.; Medow, Joshua; Mehbod, Amir A.; Melcher, Robert P.; Menezes, Arnold H.; Michelson, Gary Karlin; Mikles, Mark R.; Miller, Jared H.; Miller, Scot D.; Miraliakbar, Hamid; Misra, Sanjay N.; Mohit, Alex; Morgan, Chad J.; Mummaneni, Praveen; Murrey, Daniel B.; Neidre, Arvo; Nenadovich, Nikola; Newton, Peter O.; Nottmeier, Eric W.; Nunley, Pierce D.; O’Brien, Michael F.; O’Toole, John E.; Ohaegbulam, Chima; Ondra, Stephen L.; Onibokun, Adebukola; Ozgur, Burak M.; Pahl, Michael A.; Pan, Jeff; Papadopoulos, Stephen M.; Park, Jon; Patel, Naresh P.; Patel, Tushar C.; Peppelman, Walter C.; Perlewitz, Thomas J.; Picetti, George D.; Pimenta, Luiz; Pitzen, Tobias; Ponnappan, Ravi K.; Price, Scott; Puno, Rolando M.; Puschak, Thomas J.; Ray, Charles Dean; Reindl, Rudolf; Reyns, Nicolas; Rhodes, Diane K.; Riew, Daniel; Rodts, Gerald E.; Rogozinski, Abraham; Rogozinski, Chaim; Rosen, David S.; Roussouly, Pierre; Ruf, Michael; Ryu, Stephen I.; Samadani, Uzma; Sandhu, Faheem A.; Sasso, Rick C.; Saxena, Arjun; Schmidt, Meic H.; Shaffrey, Christopher I.; Shah, Suken A.; Shono, Yasuhiro; Shufflebarger, Harry L.; Silber, Jeff S.; Silva, Fernando E.; Silverthorn, James; Simeone, Frederick; Simmons, Edward D.; Singh, Kern; Smith, Harvey E.; Snyder, Virginia L.; Songer, Matthew; Spoonamore, Mark J.; Steinmetz, Michael P.; Steudel, Wolf Ingo; Stokes, John K.; Sturm, Christopher D.; Takemitsu, Masakazu; Tassin, Jean-Louis; Taylor, Brett A.; Taylor, William R.; Thalgott, John S.; Theofilos, Charles; Thongtrangan, Issada; Tobler, William D.; Toohey, John S.; Transfeldt, Ensor; Traynelis, Vincent C.; Tredway, Trent L.; Trost, Gregory R.; Truumees, Eeric; Vaccaro, Alexander R.; Vives, Michael J.; Voyadzis, Jean-Marc; Wang, Jeffrey C.; Webb, Scott; Weinstein, Philip R.; Welch, William C.; Wieser, Eric S.; Wong, Douglas Cabot; Woodard, Eric J.; Wright, Michael; Yuan, Philip S.; Yue, James J.; Zdeblick, Thomas A.; Zeiller, Steven; Zhang, Ho-Yeol; Zheng, Yinggang; Zigler, Jack E.
Title: Spinal Instrumentation: Surgical Techniques
Print ISBN: 9781588903754;
Online ISBN: 9781604065091;
Book DOI: 10.1055/b-002-76305
2005 © 2005 Georg Thieme Verlag KG
Georg Thieme Verlag KG, Stuttgart
Subjects: Neurosurgery
Thieme Clinical Collections (English Language)
